HUSSEN KELLI2026-02-042024-11https://etd.hu.edu.et/handle/123456789/589Copper oxide thin films were fabricated on glass substrates using the chemical bath deposition method with a deposition time of 20 minutes. The structural and optical properties of the films were investigated using X-ray diffraction (XRD) and optical analyses, focusing on the effects of varying copper acetate((CH3 .COO)2 Cu·H2 O ) as the Cu precursor concentrations., hydrazine (N2 H5 OH) as a complexion agent, and ammonium hydroxide (NH4 OH) as a pH regulator at a bath temperature of 80°C. The films were deposited by adding 1ml, 2ml, 3ml, 4ml, and 5 ml of 0.4 M copper acetate to the bath solution. The films were smooth, well-adherent, uniform, and thick. The films were characterized by X-ray diffraction for structural study and UV-VIS spectrophotometer for the study of optical properties. The XRD study revealed that the films deposited with 1 to 3 ml of copper acetate solution crystallized in the monoclinic phase of the CuO structure, with two prominent peaks at 35.5° and 38.7°, which are indexed to the (002) and (111) planes of the monoclinic CuO structure. The films deposited with 4 and 5 ml of copper acetate had an additional peak at 36.5°, which is indexed to the (111) plane of cubic Cu2 O. Optical studies revealed that the CuO thin films have a direct band transition with values of 2 eV, 1.85 eV, 1.8 eV, 1.95 eV, and 2.2eV for CuO thin films deposited with 1 ml, 2 ml, 3 ml, 4 ml, and 5 ml of copper acetate, respectivelyenCopper oxide thin filmChemical bath depositionXRDand Optical propertiesThesis